Showing results: 61 - 75 of 144 items found.
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M Series -
Introspect Technology, Inc.
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Maury Microwave Corporation
Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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AURIGA 4850 -
Focus Microwaves
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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AURIGA 4850 -
Mesuro Ltd
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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SuperK series -
NKT Photonics A/S
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Accel-RF Corporation
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Integra Technologies
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
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ACS -
Tektronix, Inc.
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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781742-01 -
NI
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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NTS3700 Series -
Novtek Test Systems
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
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Muquans, SAS
This equipment is a stand-alone device that enables to coherently regenerate an optical signal allowing long-haul dissemination of an ultra-stable optical frequency reference. Its architecture is based on the heterodyne phase-locking of a narrow spectral width laser diode on the reference signal. The station is equipped with low phase noise optical interferometer that perform a thorough characterization of the phase noise accumulated by the incoming signal, and a compensation system of this phase noise.
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Keysight Technologies
Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
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DVTest Inc.
The DVTEST LD Positioner is a two-axis elevation over azimuth positioner, for precise angular positioning with full spherical coverage. The LD Positioner is designed for the precise characterization of lightweight devices. The positioner is constructed from a low-permittivity polymer, for minimal reflections and multipath. For increased accuracy, the motor is outfitted with an absolute encoder, and laser guided calibration. A USB controller is included, with the positioner operated via Python or Matlab software libraries.
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PZ2110A -
Keysight Technologies
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Ametek Scientific Instruments
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
